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| Design of high temperature test system for high accurate ADC based on embedded structures |
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MEN Bai yong1,2, JU Xiao dong1,2, QIAO Wen xiao1,2, DENG Lin3, CHENG Xiang yang4, LU Jun qiang1,2
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(1.State Key Laboratory of Petroleum Resources and Prospecting in China University of Petroleum, Beijing 102249, China;2.Beijing Earth Explorer and Information Technology Laboratory in China University of Petroleum, Beijing 102249, China;3.Division of Northern China, China Petroleum Logging Company Limited, Renqiu 062552, China;4.College of Petroleum Engineering in China University of Petroleum, Qingdao 266555, China)
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| Abstract: |
| Based on principal and subordinate structure, high temperature test system for high accurate analog to digital converter(ADC) was designed. The host PC interconnects with embedded front end via Ethernet. The embedded front end based on ARM uClinux structure performs temperature control, power supply control and ADC test control, etc. The subsequent data processing, display and storage tasks are handled by host PC. The results show that digital phase sensitive detection algorithm is successfully applied to real time calculation of effective number of bits. The system can automatically perform testing of ADC 's vertical accuracy, power consumption, loss code and waveform distortion at 175 ℃. It provides important reference for the design, debugging and scale of logging tools. |
| Key words: logging tool high temperature test analog to digital converter(ADC) effective number of bits embedded technique network connection digital phase sensitive detection |
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